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UV Negative Resist Formulation
Polyvinyl cinnamate early 1960's
Cyclized polyisoprene polymers
sensitizers
quinones (polyvinyl)
azido compounds (polyvinyl & polyisoprene)
nitro compounds (polyvinyl)
Solvents/Developers
acetic acid } polyvinyl
notrobenzene } polyvinyl
Furfural } polyvinyl
Xylene } polyisoprene
Benzene } polyisoprene
Disadvantages
linewidth
swelling and shrinks
UV Positive Resist Formulation
Common phenol formaldehyde novolac
Sensitizer
napthoquinone diazide
Solvents/Developers
ethylene glycol monomethyl
with dilvents butyl acetate, xylene
Advantages
broader optical range
easier to remove
X-Ray Lithography
X-Ray lithography (XRL) consists of proximity printing of a mask onto a wafer.
Advantages
1) resolution and process simplicity (linewidth<1 mm)
2) no need for multilevel resist systems used in e-b lithography
3) XRL parallel writing process, e-beam is a serial; XRL higher throughput
Ion-Beam Lithography
Potential Applications - Scanning ion microscopy, X-Ray and optical
mask repair, secondary ion mass spectrometry with submicron resolution,
ion beam lithography, maskless implantation doping of semiconductors.
Source - liquid metal source (Ga, In, Au) doping, beam diameter ~ 0.1
m m, Current density 0.5 A/cm2
Scanning Ion Microscopy
Very similar to a semiconductor.
Advantage
Secondary electrons
Sputtered neutral
Secondary ions
Photons
Multilevel Resists
The purpose of multilevel resists are to develop
high resolution straight-walls, suitable for metal lift-off.
The Lift-Off Process
The above process requires the metal film to be thinner than the photoresist. This requirement limits the metal linewidth. Thinner linewidths normally require thinner photoresist layers. Multilevel and special single resist solve this level-off problem.
Single-layer lift-off - this technique involves tolune or chlorobenzene soaks. These soaks harden the resist near the surface and produce straight walls.
Planarizing layer acts as a portable conformal mask.
Advantages
Sensitivity
Linewidth control
Height-to-width aspect ratio
Proximity effects
Focus Tolerance
Resist Image Profile
Applys to optical, E-beam, X-ray, Ion-beam Lithography.